Crater - visible under diffused illumination , a surface imperfection on a wafer that can be distinguished individually 微坑-在可下明照散擴見的,晶圓片表面可區(qū)分的缺陷。
Standard test method for measurement of the luminance coefficient under diffuse illumination of pavement marking materials using a portable reflectometer 用便攜式反射計測量路面標記材料在漫射照明時發(fā)光系數(shù)的標準試驗方法